Invention Grant
- Patent Title: Probe, inspection jig, inspection device, and method of manufacturing probe
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Application No.: US16413609Application Date: 2019-05-16
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Publication No.: US10962569B2Publication Date: 2021-03-30
- Inventor: Michio Kaida , Huei Che Yu
- Applicant: Nidec-Read Corporation , SV Probe Technology Taiwan Co., Ltd.
- Applicant Address: JP Kyoto; TW Hsinchu County
- Assignee: Nidec-Read Corporation,SV Probe Technology Taiwan Co., Ltd.
- Current Assignee: Nidec-Read Corporation,SV Probe Technology Taiwan Co., Ltd.
- Current Assignee Address: JP Kyoto; TW Hsinchu County
- Agency: JCIPRNET
- Priority: JPJP2018-094974 20180516
- Main IPC: G01R1/073
- IPC: G01R1/073 ; G01R31/28 ; G01R1/067

Abstract:
Provided are a probe that enables control of a bending direction and can be simply manufactured, an inspection jig using the probe, an inspection device, and a method of manufacturing the probe. A probe has a substantially bar-like shape extending linearly and includes: a tip end portion, a body portion continuous with the tip end portion Pa; and a base end portion continuous with the body portion. The body portion includes a first connection region having a thickness in a thickness direction perpendicular to an axial direction of the bar-like shape that gradually decreases away from the tip end portion, and a second connection region having a thickness that gradually decreases away from the base end portion. A dimension of the body portion in a width direction perpendicular to the thickness direction is larger than dimensions of the tip end portion and the base end portion.
Public/Granted literature
- US20190353684A1 PROBE, INSPECTION JIG, INSPECTION DEVICE, AND METHOD OF MANUFACTURING PROBE Public/Granted day:2019-11-21
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