- 专利标题: Magnetometer apparatus
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申请号: US16032040申请日: 2018-07-10
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公开(公告)号: US10935611B2公开(公告)日: 2021-03-02
- 发明人: Joseph W. Hahn , Cedric H. Wu , Yongdan Hu , Kenneth Michael Jackson , Gregory Scott Bruce , Wilbur Lew , Andrew Raymond Mandeville , Duc Huynh
- 申请人: LOCKHEED MARTIN CORPORATION
- 申请人地址: US MD Bethesda
- 专利权人: LOCKHEED MARTIN CORPORATION
- 当前专利权人: LOCKHEED MARTIN CORPORATION
- 当前专利权人地址: US MD Bethesda
- 代理机构: Foley & Lardner LLP
- 主分类号: G01R33/032
- IPC分类号: G01R33/032 ; G01N22/00 ; G01N21/64
摘要:
A magnetometer for magnetic detection includes a magneto-optical defect center material having at least one magneto-optical defect center; a radio frequency (RF) exciter system including a radio frequency (RF) excitation source; an optical excitation system including an optical excitation source; an optical detector configured to receive an optical signal based on light emitted by the magneto-optical defect center material due RF excitation and optical excitation provided to the magneto-optical defect center material via the RF excitation source and the optical excitation source, respectively; a magnetic field generator configured to generate a magnetic field detected at the magneto-optical defect center material; and a system controller.
公开/授权文献
- US20190018076A1 MAGNETOMETER APPARATUS 公开/授权日:2019-01-17
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