- 专利标题: Micro light emitting diode testing
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申请号: US15910906申请日: 2018-03-02
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公开(公告)号: US10930201B1公开(公告)日: 2021-02-23
- 发明人: Mahdi Farrokh Baroughi , Bo Yang , Xiang Lu , Hopil Bae
- 申请人: Apple Inc.
- 申请人地址: US CA Cupertino
- 专利权人: Apple Inc.
- 当前专利权人: Apple Inc.
- 当前专利权人地址: US CA Cupertino
- 代理机构: Fletcher Yoder P.C.
- 主分类号: G09G3/32
- IPC分类号: G09G3/32 ; G09G3/00
摘要:
Methods and systems for testing a display having an array of microdrivers arranged in multiple of rows and columns including setting a testing mode of a microdriver of the array of microdrivers using multiple pins of the microdriver that are used in scanning or operation modes of the microdriver. The microdriver is configured to light one or more connected micro light emitting diode pixels coupled to the microdriver during the testing mode. Testing also includes operating the microdriver in the testing mode and determining functionality of the one or more connected micro light emitting diode pixels or the microdriver based on the testing mode.
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