- 专利标题: Method for controlling valve gates using one or more strain gauges
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申请号: US15816457申请日: 2017-11-17
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公开(公告)号: US10894349B2公开(公告)日: 2021-01-19
- 发明人: William Francis Lawless, III , Chow-Chi Huang , Gene Michael Altonen , Brandon Michael Birchmeier
- 申请人: IMFLUX INC.
- 申请人地址: US OH Hamilton
- 专利权人: IMFLUX INC.
- 当前专利权人: IMFLUX INC.
- 当前专利权人地址: US OH Hamilton
- 代理机构: Marshall, Gerstein & Borun LLP
- 主分类号: B29C45/76
- IPC分类号: B29C45/76 ; B29C45/77 ; B29C45/00 ; B29C45/28
摘要:
A method of monitoring and controlling a sequential valve gate molding apparatus in an injection molding or other molding process is disclosed. The method includes creating a target strain profile, receiving a deviation limit, receiving a change in strain relating to a first valve gate from a first strain gauge, identifying whether a deviation exists from a first portion of the target strain profile based on the output from the first strain gauge, determining whether any existing deviation exceeds the deviation limit, and adjusting the position of a first valve gate pin in the first valve gate if it does. The method may further include control of subsequent valve gates. Multiple strain gauges may be used to control a single valve gate, and/or each strain gauge may control more than one valve gate.
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