Invention Grant
- Patent Title: Method and apparatus for x-ray imaging and gain calibration of detector and detector bracket
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Application No.: US15360622Application Date: 2016-11-23
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Publication No.: US10888299B2Publication Date: 2021-01-12
- Inventor: Peijun Chen , Wei Zhao , Yongtao Tan , Rowland Saunders
- Applicant: GENERAL ELECTRIC COMPANY
- Applicant Address: US NY Schenectady
- Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee Address: US NY Schenectady
- Agency: Fletcher Yoder, P.C.
- Priority: CN201511016179 20151229
- Main IPC: A61B6/00
- IPC: A61B6/00 ; H04N5/52 ; A61B5/00 ; H04N5/367 ; H01L27/146
Abstract:
The present invention provides an X-ray detection device and an apparatus and method for calibrating an X-ray detector, the method for calibrating an X-ray detector comprising: retrieving a calibration parameter stored in the X-ray detector relative to the X-ray detector; and calibrating the X-ray detector according to the calibration parameter.
Public/Granted literature
- US20170181724A1 X-RAY DETECTION DEVICE AND APPARATUS AND METHOD FOR CALIBRATING X-RAY DETECTOR Public/Granted day:2017-06-29
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