- 专利标题： Determination of cause of error state of elements in a computing environment based on an element's number of impacted elements and the number in an error state
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申请号： US16048291申请日： 2018-07-29
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公开(公告)号： US10831587B2公开(公告)日： 2020-11-10
- 发明人: Maneesh Keshavan Bendiganavale , Pavan Belur Gopalakrishna Upadhya , Naveena Kedlaya , Vinay Sahadevappa Banakar
- 申请人： Hewlett Packard Enterprise Development LP
- 申请人地址： US TX Houston
- 专利权人： Hewlett Packard Enterprise Development LP
- 当前专利权人： Hewlett Packard Enterprise Development LP
- 当前专利权人地址： US TX Houston
- 代理机构： Hewlett Packard Enterprise Patent Department
- 主分类号： G06F11/07
- IPC分类号： G06F11/07 ; G06F16/901 ; G06F11/34
摘要：
In an example, suspect scores for impacting elements that can cause an error state of a first element are computed. The computation is performed based on states of each element for which the impacting element can cause the error state.
公开/授权文献
- US20200034222A1 DETERMINATION OF CAUSE OF ERROR STATE OF ELEMENTS 公开/授权日：2020-01-30
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