- 专利标题: Automated design testing through deep learning
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申请号: US16172991申请日: 2018-10-29
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公开(公告)号: US10783403B2公开(公告)日: 2020-09-22
- 发明人: Venkata Chandra Sekar Rao , Neeraj Kumar Tiwari , Narayan Kulkarni
- 申请人: EMC IP HOLDING COMPANY LLC
- 申请人地址: US MA Hopkinton
- 专利权人: EMC IP Holding Company LLC
- 当前专利权人: EMC IP Holding Company LLC
- 当前专利权人地址: US MA Hopkinton
- 代理商 Krishnendu Gupta; Lesley Leonessa
- 主分类号: G06K9/62
- IPC分类号: G06K9/62 ; G06N3/08 ; G06K9/46 ; G06F40/40
摘要:
A method is used in evaluating a test subject in computing environments. A first machine learning system generates test subject features. A second machine learning system analyzes the test subject to detect distinguishing features of the test subject. A third machine learning system performs natural language processing on the test subject features to create evaluation information associated with the test subject. A test subject evaluation system provides an evaluation of the test subject based on the distinguishing features and the evaluation information.
公开/授权文献
- US20200134381A1 AUTOMATED DESIGN TESTING THROUGH DEEP LEARNING 公开/授权日:2020-04-30
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