- 专利标题: Multiple three-dimensional (3-D) inspection renderings
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申请号: US15496162申请日: 2017-04-25
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公开(公告)号: US10782441B2公开(公告)日: 2020-09-22
- 发明人: Kevin Brennan , William Davidson , Patrick Splinter
- 申请人: Analogic Corporation
- 申请人地址: US MA Peabody
- 专利权人: Analogic Corporation
- 当前专利权人: Analogic Corporation
- 当前专利权人地址: US MA Peabody
- 代理机构: TraskBritt
- 主分类号: G01V5/00
- IPC分类号: G01V5/00 ; G06T19/00 ; G06T11/00
摘要:
An X-ray inspection system includes at least one display monitor and a console. The console includes at least two different visualization algorithms and a processor. The processor is configured to process volumetric image data with a first of the at least two different visualization algorithms and produce a first processed volumetric image. The processor is further configured to process the volumetric image data with a second of the at least two different visualization algorithms and produce a second processed volumetric image. The processor is further configured to concurrently display the first and second processed volumetric image data via the display monitor. The volumetric image data is indicative of a scanned object and items therein.
公开/授权文献
- US20180308255A1 Multiple Three-Dimensional (3-D) Inspection Renderings 公开/授权日:2018-10-25
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