- 专利标题: Film-forming method and film-forming apparatus
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申请号: US16291243申请日: 2019-03-04
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公开(公告)号: US10781515B2公开(公告)日: 2020-09-22
- 发明人: Kyungseok Ko , Hiromi Shima , Eiji Kikama , Keisuke Suzuki
- 申请人: TOKYO ELECTRON LIMITED
- 申请人地址: JP Tokyo
- 专利权人: TOKYO ELECTRON LIMITED
- 当前专利权人: TOKYO ELECTRON LIMITED
- 当前专利权人地址: JP Tokyo
- 代理机构: Nath, Goldberg & Meyer
- 代理商 Jerald L. Meyer
- 优先权: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2ddf5796
- 主分类号: H01L21/00
- IPC分类号: H01L21/00 ; C23C16/34 ; H01L21/02 ; C23C16/455 ; H01L21/67
摘要:
There is provided a method of forming a predetermined film by alternately supplying a film-forming raw material gas and a reaction gas onto a workpiece by an atomic layer deposition (ALD), the method including: beginning an ALD-based film formation at a first temperature at which an adsorption of the film-forming raw material gas occurs; continuing the ALD-based film formation while increasing the first temperature; and completing the ALD-based film formation at a second temperature at which a decomposition of the film-forming raw material gas occurs.
公开/授权文献
- US20190271074A1 Film-Forming Method and Film-Forming Apparatus 公开/授权日:2019-09-05
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