- 专利标题: Apparatus and method for monitoring dielectric constant of a substrate
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申请号: US16184331申请日: 2018-11-08
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公开(公告)号: US10725076B2公开(公告)日: 2020-07-28
- 发明人: Majid Ahmadloo
- 申请人: Veoneer US, Inc.
- 申请人地址: US MI Southfield
- 专利权人: Veoneer US, Inc.
- 当前专利权人: Veoneer US, Inc.
- 当前专利权人地址: US MI Southfield
- 代理机构: Burns & Levinson LLP
- 代理商 Steven M. Mills
- 主分类号: G01R27/26
- IPC分类号: G01R27/26
摘要:
A system for monitoring dielectric constant of a substrate includes a resonator structure formed on a surface of the substrate. A distal end of a waveguide is coupled to the resonator structure and spaced apart from the resonator structure such that a gap is provided between the distal end of the waveguide and the resonator structure. An excitation energy is coupled to the resonator structure out of the waveguide, and a response energy from the resonator structure is coupled into the waveguide and is detected at a proximal end of the waveguide. A detector detects the response energy received at the proximal end of the waveguide and generates a signal indicative of the detected response energy. A processor is coupled to the detector for receiving the signal indicative of the detected response energy and processing the signal to determine dielectric constant of the substrate.
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