- 专利标题: Methods and systems for improved quality inspection
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申请号: US15986699申请日: 2018-05-22
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公开(公告)号: US10706525B2公开(公告)日: 2020-07-07
- 发明人: Liang Diao , Haisong Gu , Tao Liu
- 申请人: MIDEA GROUP CO., LTD.
- 申请人地址: CN Foshan
- 专利权人: MIDEA GROUP CO. LTD.
- 当前专利权人: MIDEA GROUP CO. LTD.
- 当前专利权人地址: CN Foshan
- 代理机构: Morgan, Lewis & Bockius LLP
- 主分类号: G06T7/00
- IPC分类号: G06T7/00 ; G06K9/62 ; G06T7/11
摘要:
A method of performing automated object inspection includes obtaining a plurality of test images. For each of the plurality of test images, the method includes performing independent object inspection on each of two or more sub-portions of the test image. The method further includes segmenting the test image into at least a first sub-portion of the test image and a second sub-portion of the test image; performing object inspection on the first sub-portion of the test image using a first subset of information channels of the test image and a first model trained on a first set of training images containing the first component; and performing object inspection on the second sub-portion of the test image using a second subset of information channels of the test image, and a second model trained on a second set of training images containing the second component.
公开/授权文献
- US20190362486A1 METHODS AND SYSTEMS FOR IMPROVED QUALITY INSPECTION 公开/授权日:2019-11-28
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