- 专利标题: Inspection device and inspection method
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申请号: US16371367申请日: 2019-04-01
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公开(公告)号: US10698531B2公开(公告)日: 2020-06-30
- 发明人: Noriyuki Hoshiai , Shinichi Miyazaki
- 申请人: Sharp Kabushiki Kaisha
- 申请人地址: JP Sakai
- 专利权人: SHARP KABUSHIKI KAISHA
- 当前专利权人: SHARP KABUSHIKI KAISHA
- 当前专利权人地址: JP Sakai
- 代理机构: Keating & Bennett, LLP
- 优先权: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@7a8b24a6
- 主分类号: G01R27/26
- IPC分类号: G01R27/26 ; G06F3/041 ; G06F3/044 ; G01R17/02 ; G01R17/00
摘要:
An embodiment of the present invention makes it possible to carry out stable inspection on performance of a touch panel. An inspection device for inspecting a touch panel on a basis of a resistance value of a transparent film of the touch panel, which includes at least the transparent film, a dielectric member, and a sensor stacked on top of each other, includes: an integrating circuit configured to obtain a background capacitance of the touch panel by applying a first pulsed voltage to the sensor; and a switch configured to connect the transparent film to a ground or to a generator configured to generate a second pulsed voltage which is opposite in phase to the first pulsed voltage.
公开/授权文献
- US20190302958A1 INSPECTION DEVICE AND INSPECTION METHOD 公开/授权日:2019-10-03
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