- 专利标题: Combined image generation of article under examination and image of test item
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申请号: US16543261申请日: 2019-08-16
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公开(公告)号: US10697903B2公开(公告)日: 2020-06-30
- 发明人: Zhaolin Li , David Lieblich
- 申请人: Analogic Corporation
- 申请人地址: US MA Peabody
- 专利权人: Analogic Corporation
- 当前专利权人: Analogic Corporation
- 当前专利权人地址: US MA Peabody
- 代理机构: TraskBritt
- 主分类号: A61B6/00
- IPC分类号: A61B6/00 ; G06K9/00 ; G01N23/046 ; G06T11/00 ; G06T17/00 ; G06T19/20
摘要:
Among other things, one or more techniques and/or systems for generating a three-dimensional combined image is provided. A three-dimensional test image of a test item is combined with a three-dimensional article image of an article that is undergoing a radiation examination to generate the three-dimensional combined image. A first selection region of the three-dimensional article image is selected. The three-dimensional test image of the test item is inserted within the first selection region. Although the test item is not actually comprised within the article under examination, the three-dimensional combined image is intended to cause the test item to appear to be comprised within the article.
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