Invention Grant
- Patent Title: Neural electrode for measuring neural signal and method for manufacturing the same
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Application No.: US16116810Application Date: 2018-08-29
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Publication No.: US10582865B2Publication Date: 2020-03-10
- Inventor: Yong Hee Kim , Sang Don Jung
- Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Applicant Address: KR Daejeon
- Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee Address: KR Daejeon
- Priority: KR10-2017-0118059 20170914
- Main IPC: A61B5/04
- IPC: A61B5/04 ; C25D9/04 ; C25D5/34 ; C25D7/06 ; B82Y40/00 ; B82Y30/00
Abstract:
Provided are a neural electrode for measuring a neural signal, and a method for manufacturing the same. The method for manufacturing the same includes forming an ITO electrode on a substrate, forming a passivation layer for exposing a portion of the ITO electrode, forming ITO nanowires on the ITO electrode, and forming a metal oxide on the ITO nanowires.
Public/Granted literature
- US20190076038A1 NEURAL ELECTRODE FOR MEASURING NEURAL SIGNAL AND METHOD FOR MANUFACTURING THE SAME Public/Granted day:2019-03-14
Information query
