Invention Grant
- Patent Title: Optical unit for multi-angle optical characteristic measuring device, and multi-angle optical characteristic measuring device
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Application No.: US16326102Application Date: 2017-08-15
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Publication No.: US10578546B2Publication Date: 2020-03-03
- Inventor: Toshio Kawano
- Applicant: KONICA MINOLTA, INC.
- Applicant Address: JP Tokyo
- Assignee: Konica Minolta, Inc.
- Current Assignee: Konica Minolta, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Cozen O'Connor
- Priority: JP2016-165570 20160826
- International Application: PCT/JP2017/029391 WO 20170815
- International Announcement: WO2018/037973 WO 20180301
- Main IPC: G01J3/00
- IPC: G01J3/00 ; G01N21/25 ; G01J3/51 ; G01N21/47 ; G01N21/27

Abstract:
A multi-angle optical characteristic measuring device and an optical unit therefor include: an illuminating portion that irradiates a measurement point with an illuminating light beam; a plurality of reflecting mirrors that are arranged facing the measurement point at a plurality of different observation angles, and modify traveling directions of measurement light beams emitted from the measurement point in response to the illuminating light beam; one light receiving optical system that receives the measurement light beams from the plurality of reflecting mirrors; and a two-dimensional detecting portion that detects the measurement light beams received by the light receiving optical system, and the plurality of reflecting mirrors modifies the traveling directions of the measurement light beams such that the two-dimensional detecting portion detects the measurement light beams at different positions on the two-dimensional detecting portion.
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