Disclosed is a panel testing device. The panel testing device includes: a supporter and a plurality of test pins disposed on the supporter, wherein the plurality of test pins are in one-to-one correspondence with a plurality of signal pins on the tested panel, any one of the test pins satisfies d≤D≤d+L; wherein D is a width of the test pin, d is a width of the signal pin corresponding to the test pin, L is a minimum pitch between two adjacent signal pins.