- 专利标题: Apparatuses, systems, and methods for ion traps
-
申请号: US16399568申请日: 2019-04-30
-
公开(公告)号: US10546734B1公开(公告)日: 2020-01-28
- 发明人: Daniel Youngner
- 申请人: Honeywell International Inc.
- 申请人地址: US NJ Morris Plains
- 专利权人: Honeywell International Inc.
- 当前专利权人: Honeywell International Inc.
- 当前专利权人地址: US NJ Morris Plains
- 代理机构: Brooks, Cameron & Huebsch, PLLC
- 主分类号: H01J49/00
- IPC分类号: H01J49/00
摘要:
Apparatuses, systems, and methods for ion traps are described herein. One apparatus includes a number of microwave (MW) rails and a number of radio frequency (RF) rails formed with substantially parallel longitudinal axes and with substantially coplanar upper surfaces. The apparatus includes two sequences of direct current (DC) electrodes with each sequence formed to extend substantially parallel to the substantially parallel longitudinal axes of the MW rails and the RF rails. The apparatus further includes a number of through-silicon vias (TSVs) formed through a substrate of the ion trap and a trench capacitor formed in the substrate around at least one TSV.
公开/授权文献
- US20200027684A1 APPARATUSES, SYSTEMS, AND METHODS FOR ION TRAPS 公开/授权日:2020-01-23
信息查询