- 专利标题: System and method for a synthetic trace model
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申请号: US15140246申请日: 2016-04-27
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公开(公告)号: US10546075B2公开(公告)日: 2020-01-28
- 发明人: YwhPyng Harn , Fa Yin , Xiaotao Chen
- 申请人: Futurewei Technologies, Inc.
- 申请人地址: US TX Plano
- 专利权人: FUTUREWEI TECHNOLOGIES, INC.
- 当前专利权人: FUTUREWEI TECHNOLOGIES, INC.
- 当前专利权人地址: US TX Plano
- 代理机构: Slater Matsil, LLP
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
A system and method for a synthetic trace model includes providing a first system model, the first system model comprising a plurality of subsystem models, each of the plurality of subsystem models having a trace format, generating a first plurality of traces from an overall pool of trace instructions, each of the first plurality of traces generated for respective ones of the plurality of subsystem models, according to the trace format of the subsystem model, executing the traces on each of the subsystem models, and evaluating execution characteristics for each trace executed on the first system model.
公开/授权文献
- US20160335379A1 System and Method for a Synthetic Trace Model 公开/授权日:2016-11-17
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