- 专利标题: High-current PCB traces
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申请号: US15491727申请日: 2017-04-19
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公开(公告)号: US10537016B2公开(公告)日: 2020-01-14
- 发明人: Travis C. Mallett , Ben M. Armstrong , Forrest A. Rahrer
- 申请人: Schweitzer Engineering Laboratories, Inc.
- 申请人地址: US WA Pullman
- 专利权人: Schweitzer Engineering Laboratories, Inc.
- 当前专利权人: Schweitzer Engineering Laboratories, Inc.
- 当前专利权人地址: US WA Pullman
- 代理商 Jared L. Cherry
- 主分类号: H05K1/02
- IPC分类号: H05K1/02 ; H05K1/11 ; H05K3/40
摘要:
The present disclosure relates to systems and methods using thermal vias to increase the current-carrying capacity of conductive traces on a multilayered printed circuit board (PCB). In various embodiments, parameters associated with vias may be selected to control various electrical and thermal properties of the conductive trace. Such parameters include the via diameter, a plating thickness, a number of vias, a placement of the vias, an amount of conductive material to be added or removed from the conductive trace, a change in the resistance of the conductive trace, a change in a fusing measurement of the conductive trace, and the like.
公开/授权文献
- US20170311440A1 High-Current PCB Traces 公开/授权日:2017-10-26
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