- 专利标题: Machine learning device, machine learning system, and machine learning method
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申请号: US16050252申请日: 2018-07-31
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公开(公告)号: US10532432B2公开(公告)日: 2020-01-14
- 发明人: Yoshitaka Kubo
- 申请人: FANUC CORPORATION
- 申请人地址: JP Yamanashi
- 专利权人: Fanuc Corporation
- 当前专利权人: Fanuc Corporation
- 当前专利权人地址: JP Yamanashi
- 代理机构: Wenderoth, Lind & Ponack, L.L.P.
- 优先权: JP2017-163735 20170828
- 主分类号: G06K9/62
- IPC分类号: G06K9/62 ; B23K26/70 ; G06T7/00 ; B23K31/00
摘要:
Quality judgment on a laser beam intensity distribution is performed by taking an observation condition of the laser beam into consideration. A machine learning device includes: a state observing means that acquires data indicating an intensity distribution of a laser beam and data indicating a condition for observing the laser beam, performed to generate the data indicating the intensity distribution as input data; a label acquisition means that acquires an evaluation value related to judgment of the quality of the laser beam as a label; and a learning means that performs supervised learning using a pair of the input data acquired by the state observing means and the label acquired by the label acquisition means as training data to construct a learning model for judging the quality of the laser beam.
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