- 专利标题: X-ray source for ionizing of gases
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申请号: US15552388申请日: 2016-02-24
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公开(公告)号: US10529527B2公开(公告)日: 2020-01-07
- 发明人: Thomas Sebald
- 申请人: ESTION TECHNOLOGIES GMBH
- 申请人地址: DE Griesheim
- 专利权人: ESTION TECHNOLOGIES GMBH
- 当前专利权人: ESTION TECHNOLOGIES GMBH
- 当前专利权人地址: DE Griesheim
- 代理机构: Heslin Rothenberg Farley and Mesiti PC
- 代理商 Nicholas Mesiti
- 优先权: DE102015102612 20150224
- 国际申请: PCT/DE2016/100081 WO 20160224
- 国际公布: WO2016/134701 WO 20160901
- 主分类号: H01J35/06
- IPC分类号: H01J35/06 ; H01J35/18
摘要:
An X-ray source for ionizing of gases includes a field emission tip array within a vacuum region enclosed by a hood and a part of a support plate. The field emission tip array is arranged electrically insulated with respect to the carrier plate and wired as a cathode connected to a high-voltage source. A transmission window transparent to X-ray radiation is arranged in the hood centrally above the field emission tip array, and the hood is wired as an anode.
公开/授权文献
- US20180247785A1 X-RAY SOURCE FOR IONIZING OF GASES 公开/授权日:2018-08-30
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