- 专利标题: Image inspection apparatus and image inspection method
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申请号: US15955735申请日: 2018-04-18
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公开(公告)号: US10508994B2公开(公告)日: 2019-12-17
- 发明人: Daisuke Ando
- 申请人: Keyence Corporation
- 申请人地址: JP Osaka
- 专利权人: Keyence Corporation
- 当前专利权人: Keyence Corporation
- 当前专利权人地址: JP Osaka
- 代理机构: Kilyk & Bowersox, P.L.L.C.
- 优先权: JP2017-108095 20170531
- 主分类号: G01N21/88
- IPC分类号: G01N21/88 ; G01N21/55 ; G01N21/01 ; H04N7/12 ; G06T7/00
摘要:
An image inspection apparatus includes an illuminating section for irradiating illumination light, a line camera in which a plurality of imaging elements are arrayed to be linearly arranged, the line camera receiving the light irradiated from the illuminating section and reflected on the inspection target object, a display section for displaying an image captured by the line camera, an optical axis adjusting section for adjusting an optical axis of the line camera, a trigger setting section for specifying a trigger that specifies timing when the inspection target object is imaged by the line camera, an aspect ratio adjusting section for adjusting longitudinal and lateral pixel resolutions of the image captured by the line camera, and a display control section for displaying the optical axis adjusting section, the trigger setting section, and the aspect ratio adjusting section on the display section in order.
公开/授权文献
- US20180348144A1 Image Inspection Apparatus And Image Inspection Method 公开/授权日:2018-12-06
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