- 专利标题: Ultra-high modulus and etch selectivity boron-carbon hardmask films
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申请号: US15233351申请日: 2016-08-10
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公开(公告)号: US10418243B2公开(公告)日: 2019-09-17
- 发明人: Prashant Kumar Kulshreshtha , Ziqing Duan , Karthik Thimmavajjula Narasimha , Kwangduk Douglas Lee , Bok Hoen Kim
- 申请人: Applied Materials, Inc.
- 申请人地址: US CA Santa Clara
- 专利权人: APPLIED MATERIALS, INC.
- 当前专利权人: APPLIED MATERIALS, INC.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Patterson + Sheridan LLP
- 主分类号: H01L21/302
- IPC分类号: H01L21/302 ; H01L21/033 ; H01L21/3065 ; C23C16/505 ; H01L21/02 ; C23C16/32
摘要:
Implementations of the present disclosure generally relate to the fabrication of integrated circuits. More particularly, the implementations described herein provide techniques for deposition of boron-carbon films on a substrate. In one implementation, a method of processing a substrate is provided. The method comprises flowing a hydrocarbon-containing gas mixture into a processing volume of a processing chamber having a substrate positioned therein, wherein the substrate is heated to a substrate temperature from about 400 degrees Celsius to about 700 degrees Celsius, flowing a boron-containing gas mixture into the processing volume and generating an RF plasma in the processing volume to deposit a boron-carbon film on the heated substrate, wherein the boron-carbon film has an elastic modulus of from about 200 to about 400 GPa and a stress from about −100 MPa to about 100 MPa.
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