Invention Grant
- Patent Title: Gloss evaluation method and gloss evaluation device
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Application No.: US15033733Application Date: 2014-09-16
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Publication No.: US10302562B2Publication Date: 2019-05-28
- Inventor: Toshio Kawano , Yushi Nobumoto
- Applicant: KONICA MINOLTA, INC.
- Applicant Address: JP Tokyo
- Assignee: KONICA MINOLTA, INC.
- Current Assignee: KONICA MINOLTA, INC.
- Current Assignee Address: JP Tokyo
- Agency: Cozen O'Connor
- Priority: JP2013-235967 20131114
- International Application: PCT/JP2014/074397 WO 20140916
- International Announcement: WO2015/072223 WO 20150521
- Main IPC: G01N21/57
- IPC: G01N21/57 ; G01N21/55 ; G01J3/50 ; G01N21/27

Abstract:
In a gloss evaluation method and a gloss evaluation apparatus according to the present invention, an intensity P of specular light obtained by illuminating an object to be measured with illumination light of spectral irradiance emitted from the reference machine is obtained from an intensity of specular light obtained by illuminating the object to be measured with first illumination light of spectral irradiance from a relevant machine, based on an intensity b of dispersed reflected light obtained by illuminating the object to be measured with the first illumination light, and a spectral reflectance of diffuse reflection light obtained by illuminating the object to be measured with predetermined second illumination light from a different illuminating angle.
Public/Granted literature
- US20160258865A1 Gloss Evaluation Method And Gloss Evaluation Device Public/Granted day:2016-09-08
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