- 专利标题： Dual gate array substrate, testing method, display panel and display apparatus
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申请号： US15534526申请日： 2016-06-27
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公开(公告)号： US10283027B2公开(公告)日： 2019-05-07
- 发明人: Xinfeng Ren
- 申请人： BOE TECHNOLOGY GROUP CO., LTD. , HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
- 申请人地址： CN Beijing CN Anhui
- 专利权人： BOE TECHNOLOGY GROUP CO., LTD.,HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
- 当前专利权人： BOE TECHNOLOGY GROUP CO., LTD.,HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
- 当前专利权人地址： CN Beijing CN Anhui
- 代理机构： Calfee, Halter & Griswold LLP
- 优先权： CN201610173093 20160324
- 国际申请： PCT/CN2016/087237 WO 20160627
- 国际公布： WO2017/161722 WO 20170928
- 主分类号： G09G3/00
- IPC分类号： G09G3/00 ; G01R31/28 ; H01L27/12 ; H01L27/28 ; H01L29/786
摘要：
A dual gate array substrate is disclosed. In two vertically adjacent pixel pairs, two pixel units in each of the pixel pairs are connected to the same data line of the two adjacent data lines respectively, and two adjacent pixel units in the two pixel pairs in an extending direction of the data line are connected to different data lines in the two adjacent data lines respectively; in two adjacent pixel pairs in an extending direction of any set of the dual gate lines, a data line connected to two pixel units in one pixel pair is different from but adjacent to a data line connected to two pixel units in the other pixel pair; and two adjacent pixel units in the extending direction of the data line are connected to their respective adjacent gate lines transmitting different scan signals respectively.
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