- Patent Title: Apparatus and method for multi-bit error detection and correction
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Application No.: US14981649Application Date: 2015-12-28
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Publication No.: US10268539B2Publication Date: 2019-04-23
- Inventor: Wei Wu , Brian J. Hickmann , Dennis R. Bradford
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Nicholson De Vos Webster & Elliott LLP
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G06F11/10 ; G11C29/52 ; H03M13/00 ; H03M13/13 ; H03M13/15 ; H03M13/27

Abstract:
An apparatus and method are described for multi-bit error correction and detection. For example, one embodiment of a processor comprises: error detection logic to detect one or more errors in data when reading the data from a storage device, the data being read from the storage device with parity codes and error correction codes (ECCs); error correction logic to correct the errors detected by the error detection logic; and a matrix usable by both the error detection logic to detect the one or more errors and the error correction logic to correct the errors, the matrix constructed into N regions, each region having M columns forming a geometric sequence, wherein each successive region is a shifted version of a prior region.
Public/Granted literature
- US20170185476A1 APPARATUS AND METHOD FOR MULTI-BIT ERROR DETECTION AND CORRECTION Public/Granted day:2017-06-29
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