Systems, methods, and devices for training models or algorithms for classifying or detecting particles or materials in microscopy images are disclosed. A method includes receiving a plurality of microscopy images of a specimen and a classification for the specimen. The plurality of microscopy images includes a first image captured at a first magnification and a second image captured at the first magnification with a different focus than the first image. The method includes training a machine learning model or algorithm using the plurality of images, wherein the first image and the second image are provided with one or more labels indicating the classification.