- 专利标题: Rapid antimicrobial susceptibility test, based on an analysis of changes in morphology and growth pattern of a microbial cell under different concentrations of various antimicrobial agents, and automated cell image analysis system therefor
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申请号: US14883101申请日: 2015-10-14
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公开(公告)号: US10208328B2公开(公告)日: 2019-02-19
- 发明人: Yong-Gyun Jung , Eun-Geun Kim , Jung Heon Yoo , Sunghoon Kwon , Jungil Choi , Hee Chan Kim , Jung Chan Lee , Eui Jong Kim , Sang Hoon Song , Sei Ick Joo , Ji Soo Lee
- 申请人: Quanta Matrix Co., Ltd.
- 申请人地址: KR Seoul
- 专利权人: QUANTAMATRIX INC.
- 当前专利权人: QUANTAMATRIX INC.
- 当前专利权人地址: KR Seoul
- 代理机构: STIP Law Group, LLC
- 优先权: KR10-2014-0138535 20141014
- 主分类号: C12Q1/18
- IPC分类号: C12Q1/18
摘要:
Provided are a rapid antimicrobial susceptibility test, based on an analysis of changes in morphology and growth pattern of a microbial cell under different concentrations of various antimicrobial agents, and an automated cell image analysis system therefor. The antimicrobial susceptibility test is rapidly performed based on an analysis of changes in morphology and growth pattern of a microbial cell under different concentrations of various antimicrobial agents, and this makes it possible to obtain highly reliable test results faster by six to seven times than the standard method recommended by Clinical and Laboratory Standards Institute (CLSI).
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