The system (21) includes: a power transistor (22), a data medium (60) including data relating to the manufacturing tolerance (Tol) of at least one electric parameter of the transistor (22), an electric circuit (26) for controlling the transistor adapted so as to operate for a reference value of the parameter (VREF), an electric circuit (64) having an inductance of less than 100 nH and such that the assembly (70) formed with the circuit (64) and the transistor (22) has a value for the parameter, for which the deviation in absolute with the reference value is strictly less than the manufacturing tolerance (Tol).