- 专利标题: Testing method of touch device and system thereof
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申请号: US14174854申请日: 2014-02-07
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公开(公告)号: US10126879B2公开(公告)日: 2018-11-13
- 发明人: Shih-Wen Chen , Chun-Chieh Li , Ya-Ping Lin
- 申请人: Wistron Corporation
- 申请人地址: TW New Taipei
- 专利权人: Wistron Corporation
- 当前专利权人: Wistron Corporation
- 当前专利权人地址: TW New Taipei
- 代理机构: JCIPRNET
- 优先权: TW102136569A 20131009
- 主分类号: G06F3/042
- IPC分类号: G06F3/042 ; G06F3/041
摘要:
A testing method of a touch device and a system thereof are provided. The testing method includes following steps. A test sensing information generated by the touch device is received, and the test sensing information is physical characteristic information provided by sensors of the touch device. A test gesture signal and a test keypad signal generated by the touch device are received, the test gesture signal includes gesture coordinates provided by touch device, and the test keypad signal includes a keypad key triggering signal generated by the touch device. According to a preset table, in order to generate a test result, whether the test sensing information, the test gesture signal, and the test keypad signal match data of the preset table or not is determined, and whether the touch device works properly is determined according to the test result.
公开/授权文献
- US20150100254A1 TESTING METHOD OF TOUCH DEVICE AND SYSTEM THEREOF 公开/授权日:2015-04-09
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