- 专利标题: Computer aided diagnosis (CAD) apparatus and method
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申请号: US14950543申请日: 2015-11-24
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公开(公告)号: US10083502B2公开(公告)日: 2018-09-25
- 发明人: Seung Woo Ryu , Seung Chul Chae , Jung Hoe Kim
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si
- 代理机构: Jefferson IP Law, LLP
- 优先权: KR10-2014-0166736 20141126
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; G06T7/00 ; G06K9/62 ; A61B8/00 ; A61B8/08 ; A61B5/00 ; A61B5/055 ; A61B6/12 ; A61B6/00 ; A61B8/14
摘要:
Disclosed are Computer Aided Diagnosis (CAD) apparatus and method to combine information on sequential image frames and to provide a superior classification result for the ROI in the image frame. The CAD apparatus may include a Region of Interest (ROI) detector configured to detect an ROI from image frames, a categorizer configured to create groups of image frames having successive ROI sections from among the image frames based on a result of the detection, a classifier configured to classify an ROI detected from each of the image frames belonging to the groups, and a result combiner configured to combine classification results for the image frames belonging to each group from the groups and to calculate a group result for the each group.
公开/授权文献
- US20160148376A1 COMPUTER AIDED DIAGNOSIS (CAD) APPARATUS AND METHOD 公开/授权日:2016-05-26
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