- 专利标题: Antenna impedance matching and aperture tuning circuitry
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申请号: US14931720申请日: 2015-11-03
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公开(公告)号: US10062629B2公开(公告)日: 2018-08-28
- 发明人: George Maxim , Dirk Robert Walter Leipold , Marcus Granger-Jones , Baker Scott
- 申请人: RF Micro Devices, Inc.
- 申请人地址: US NC Greensboro
- 专利权人: Qorvo US, Inc.
- 当前专利权人: Qorvo US, Inc.
- 当前专利权人地址: US NC Greensboro
- 代理机构: Withrow & Terranova, P.L.L.C.
- 主分类号: H03H7/38
- IPC分类号: H03H7/38 ; H01L23/31 ; H01L21/304 ; H01L21/02 ; H01L21/683 ; H01L23/29 ; H01L23/373 ; H01L23/00 ; H05K1/02 ; H05K1/18 ; H01Q1/50 ; H01L23/36 ; H01L21/56 ; H01L23/20 ; H01L23/367 ; H01L21/306 ; H01L23/522 ; H01L49/02
摘要:
Antenna aperture tuning circuitry includes a first signal path and a second signal path coupled in parallel between an antenna radiating element and ground. A first LC resonator and a second LC resonator are each coupled between the first signal path and ground. The first LC resonator and the second LC resonator are electromagnetically coupled such that a coupling factor between the first LC resonator and the second LC resonator is between about 1.0% and 40.0%. A third LC resonator and a fourth LC resonator are each coupled between the second signal path and ground. The third LC resonator and the fourth LC resonator are electromagnetically coupled such that a coupling factor between the third LC resonator and the fourth LC resonator is between about 1.0% and 40.0%.
公开/授权文献
- US20160126623A1 ANTENNA IMPEDANCE MATCHING AND APERTURE TUNING CIRCUITRY 公开/授权日:2016-05-05
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