- 专利标题: Evaluating fairness in devices under test
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申请号: US14846879申请日: 2015-09-07
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公开(公告)号: US10061679B2公开(公告)日: 2018-08-28
- 发明人: Dean G. Bair , Rebecca M. Gott , Edward J. Kaminski, Jr. , William J. Lewis
- 申请人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 代理机构: Heslin Rothenberg Farley & Mesiti P.C.
- 代理商 William A. Kinnaman, Jr., Esq.; Blanche E. Schiller, Esq.
- 主分类号: G06F17/50
- IPC分类号: G06F17/50 ; G06F11/34 ; G01R31/26 ; G06F13/00
摘要:
Pre-silicon fairness evaluation to detect fairness issues pre-silicon. Drivers drive a plurality of commands on one or more interfaces of a device under test to test the device under test. State associated with the device under test is checked. Based on the state, a determination is made as to whether the drivers are to continue driving commands against the device under test. Based on determining that the drivers are to continue driving the commands, a further determination is made as to whether a predefined limit has been reached. Based on determining the predefined limit has been reached, ending the test of the device under test in which the test fails.
公开/授权文献
- US20160092334A1 EVALUATING FAIRNESS IN DEVICES UNDER TEST 公开/授权日:2016-03-31
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