- 专利标题: Comparing twice-read memory cell data for error detection in a memory device
-
申请号: US15066773申请日: 2016-03-10
-
公开(公告)号: US10014071B2公开(公告)日: 2018-07-03
- 发明人: Min-Su Park , Jae-Il Kim , Tae-Kyun Kim , Jun-Gi Choi
- 申请人: SK hynix Inc.
- 申请人地址: KR Gyeonggi-do
- 专利权人: SK Hynix Inc.
- 当前专利权人: SK Hynix Inc.
- 当前专利权人地址: KR Gyeonggi-do
- 代理机构: IP & T Group LLP
- 优先权: KR10-2015-0127462 20150909
- 主分类号: G11C29/08
- IPC分类号: G11C29/08 ; G11C11/406 ; G11C11/4091 ; G11C29/00
摘要:
A memory device may include a plurality of memory cells; an error detection unit suitable for: latching data read a first time from at least one selected memory cell of the plurality of memory cells in a detection period, comparing data read a second time from the at least one selected memory cell with the latched data, and detecting an error of the at least one selected memory cell in the detection when the date read a second time from the at least one substantially the same with the latched data.
公开/授权文献
- US20170068583A1 MEMORY DEVICE 公开/授权日:2017-03-09
信息查询