The invention discloses a substrate integrated slot waveguide test board for a near-field coupling passive intermodulation test. The substrate integrated slot waveguide test board comprises a ground plane layer and a dielectric substrate which are sequentially arranged from bottom to top, wherein the dielectric substrate is provided with a substrate integrated waveguide section, a first impedancematching transition section, a second impedance matching transition section, an input end and an output end which are integrally formed; the input end and the output end are respectively arranged on the front side and the rear side of the substrate integrated waveguide section; wherein the input end is connected with the substrate integrated waveguide section through the first impedance matching transition section, the output end is connected with the substrate integrated waveguide section through the second impedance matching transition section, a high-temperature insulating film is arrangedon the substrate integrated waveguide section, and rectangular gaps are formed in the middle of the substrate integrated waveguide section and the corresponding positions of the high-temperature insulating film. According to the invention, online replacement of the to-be-tested structure can be realized in the PIM test process, accurate control of multiple physical field factors influencing the PIM product is facilitated, and the PIM diagnosis efficiency is improved.