The invention discloses a device suitable for high-temperature and high-pressure tests. The device comprises an upper cushion block, a lower cushion block and a sample; the sample is placed between the upper cushion block and the lower cushion block; an upper sealing structure is arranged on the outer surface of the upper cushion block; a lower sealing structure is arranged on the outer surface ofthe lower cushion block; the device further comprises a normal-temperature heat shrinkable tube, the upper end of the normal-temperature heat shrinkable tube is located between the edge of the uppercushion block and the upper sealing structure, and the lower end of the normal-temperature heat shrinkable tube is located between the edge of the lower cushion block and the lower sealing structure;and an FEP teflon heat shrinkable tube is arranged on the outer surface of the normal-temperature heat shrinkable tube. The invention further relates to a film lamination method suitable for the high-temperature and high-pressure tests. The device and the film lamination method in the invention have the advantages of being reasonable in structure, convenient to use, good in sealing performance, not easy to damage during the experiment process, convenient to operate and the like.