The invention relates to a plane optical component surface quality rapid detecting device and method. The device comprises a photoelectric detector 1, a photoelectric detector 2 and a two-dimensionalrotation system, wherein the photoelectric detector 1 is combined with a beam splitter and is placed in a detected light path so as to measure incident light energy; the photoelectric detector 2 is fixed in an inner detecting hole of an integrating sphere to measure scattered light energy; and the two-dimensional rotation system is used for fixing a component to be tested and is installed on an XYguide rail to achieve multi-axis linkage of the component to be tested. A measuring principle is characterized in that a detection light beam emitted by a laser light source successively passes through the beam splitter, a laser beam expander, and a high reflection mirror, and is projected into the tested component through an integrating sphere incidence hole so as to form scattered light; a mirror portion of the scattered light leaves the integrating sphere through an integrating sphere emitting/sample hole and is collected by a light collector; and a diffuse scattering portion of the scattered light is reflected multiple times in the integrating sphere to form uniform light, which is measured by the photoelectric detector 2. The detecting device can realize rapid detection of a grade ofdefects on the surface of the plane optical component.