The invention provides a device spot inspection method and device. The device spot inspection method is applied to the technical field of device detection. The device spot inspection method includes the steps that acoustic wave data of a to-be-detected device are collected according to the spot inspection sequence; if the acoustic wave data meet a first preset threshold range, first temperature data of the to-be-detected device and the current indoor temperature are collected; a preset temperature corresponding table is queried to obtain a standard temperature range corresponding to the current indoor temperature; if the first temperature data are within the standard temperature range, the operating state of the to-be-detected device is determined to be normal; and if the first temperaturedata are outside the standard temperature range, the fact that a fault exists in operation of the to-be-detected device is determined. According to the device spot inspection method and device, the spot inspection accuracy can be ensured while the spot inspection efficiency is improved.