This probe pin (10) is provided with: an elastic part (20); a first contact part (30) provided with a pair of leg parts (32, 33) which extend along the longitudinal direction from one end of the elastic part (20), and are capable of bending in directions heading away from each other, said first contact part being further provided with a pair of contact points (321, 331) which are provided to the tips of the pair of leg parts (32, 33), are impelled in a direction along the longitudinal direction by the elastic part (20) via the pair of leg parts (32, 33), and are capable of coming into contactwith a protruded contact point of an object to be examined; and a second contact part (40) which is provided to another end of the elastic part (20), and which is electrically connected to the first contact part (30). A gap (34) into which the protruded contact point of the object to be examined can be inserted is provided between the pair of leg parts (32, 33). The pair of contact points (321, 331) and the protruded contact point are capable of coming into contact with each other when the protruded contact point is inserted into the gap (34).