The invention discloses a test method and device for detecting voltage resistance of a CCL material. The method includes the following content: the laminates, sheet material and model selection of a test board are arranged according to test requirements; each layer of the test board is provided with a copper sheet as a test area; the copper sheets of the layers which serve as the test areas are arranged in an overlapped manner; a CCL material that needs testing is arranged between adjacent layers as a medium; each layer leads out a wire from the copper sheet serving as the test area to the surface of the test board; the outer end of the lead is provided with a voltage input point; and during a test, a pressurization test is carried out at a voltage input point of adjacent layers of a substrate to be tested. The test method provided by the invention can accurately position a board voltage resistance level, and during design of a PCB card, a board of the corresponding level can be selected with reference to a design limit value, thereby improving long-time running reliability of a system.