Being applicable to the data processing field, the invention provides a heat induction defect detection method and system. The method includes: extracting the image of a to-be-detected apparatus from infrared images, and identifying the equipment type and heat induction defect type of the to-be-detected apparatus; according to the equipment type and the heat induction defect type, selecting a corresponding heat induction defect analysis method for the to-be-detected apparatus, and selecting a heating analysis area from a heating part in the to-be-detected apparatus, wherein the heating analysis area includes a frame selected area and a line segment area; according to the heating analysis area and the heat induction defect analysis method, analyzing whether a heat induction defect appears in the to-be-detected apparatus. According to the invention, the specific heating analysis area and heat induction defect analysis method are determined according to the equipment type and the corresponding heat induction defect type of the to-be-detected apparatus, different analysis for different apparatuses is fully achieved, so that the judgment about the existence of a heat induction defect in the apparatus can be more accurate and reliable, and the heat induction defect detection result of the apparatus can be more accurate.