The invention relates to the field of analysis detection, and concretely relates to an enhanced thin-layer chromatography-surface enhanced Raman scattering (eTLC-SERS) analysis method. The method comprises the following steps: an eTLC platform is established; a sample solution and a HCL solution are prepared; SERS activity of the eTLC platform enables in-situ detection; an expansion process of eTLC is carried out; and Raman spectrum is collected. The invention provides a novel analysis method by combining SERS enhancement and thin-layer chromatography separation, a SERS active substrate is not required for adding while detecting, influence of coffee-ring effect in a traditional method is eliminated, detection error is reduced, detection sensitivity is obviously increased, and the operation steps are simplified. For a compound which cannot position the spot after separating, the eTLC-SERS method can be employed for detecting by using a point-by-point scanning mode, compared with the traditional method, the application scope of the eTLC-SERS method is larger, and the application prospect is wider.