A method for increasing the material identification capability of a dual-energy radiation system and the dual-energy radiation system. The method comprises: step one, determining the atomic number and thickness of a to-be-inspected material; step two, calculating a pulse number ratio or a pulse dose ratio on the basis of the atomic number and thickness of the to-be-inspected material; and, step three, adjusting the pulse number ratio or pulse dose ratio of the dual-energy radiation system to the calculated ratios. Utilization of the method allows rapid acquisition of the optimal material identification state of the dual-energy radiation system; with scan-inspection being performed in this state, the material identification capability of the dual-energy system is substantially improved.