The invention belongs to the field of touch screens, and provides an ITO circuit pattern. The leading-out ends of the two ends of the ITO circuit pattern are respectively provided with an elargol point in a silk-screen mode. The invention further provides a test method of the ITO circuit pattern. The method comprises the steps that the leading-out ends of the two ends of the ITO circuit pattern are provided with elargol in a silk-screen mode to form the multiple elargol points; when the ITO circuit pattern needs to be tested, two probes of a test device are in contact with the elargol points at the two ends of the ITO circuit pattern respectively so as to test the ITO circuit pattern. The leading-out ends of the two ends of the ITO circuit pattern are provided with the elargol points in the silk-screen mode so that the specific positions of all circuits can be clearly recognized. In the process of testing, the probes of the test device can be in contact with the elargol points for testing conveniently, the probes are prevented from carrying out pressure measurement on the leading-out ends of the ITO circuit pattern, and then accuracy and efficiency of testing the ITO circuit pattern are improved.