The invention discloses an automatic testing device of frequency devices. The automatic testing device comprises a computer, an integrated control unit, a frequency meter and at least one high-low temperature chamber. The integrated control unit comprises a core central processing unit (CPU), and the core CPU is in interactive communication with the computer. The high-low temperature chamber is provided with a high-low temperature control unit, and a plurality of selecting testing units are arranged inside the high-low temperature chamber. The selecting testing units comprise a plurality of sets of testing stations. Each set of testing station comprises a 4514 decoder, a plurality of gating switches and a plurality of device bases. A plurality of output ends of the 4514 decoder are respectively connected at control ends of the plurality of gating switches, output ends of the plurality of device bases are respectively connected with input ends of the plurality of gating switches, output ends of the plurality of gating switches are mutually connected and then are connected to an input end of the frequency meter, and the frequency meter sends a tested result to the computer in an electrical signal mode through the core CPU. The automatic testing device of the frequency devices has the advantages of achieving automated testing and being time-saving, labor-saving and high in production efficiency.