The invention relates to an industrial device rapid locating method based on machine vision, which is a device locating method adopted by machine vision software running in a hardware environment built by an industrial lens, an industrial camera, an image gathering card and an industrial personal computer. The method provided by the invention is a method with combined multiresolution analysis andwavelet transformation characteristics, and the method comprises the following steps of: firstly locating approximately according to the projection transformation vectors of horizontal and vertical direction coefficients of wavelet transformation, then implementing template matching in a low-resolution image, and finally accurately locating in the approximately located field of the original image. The application effect of the method in semiconductor and electronic manufacturing industry is excellent, the locating speed is particularly and obviously improved by means of multiresolution analysis and location preparation, and the locating process of a wafer can be completed in about 10 milliseconds.