The invention relates to a high-speed yaw scanning control device for testing quality of electron beam current. A complicated programmable logic device is respectively connected with a serial communication circuit and the like; the serial communication circuit is connected with an industrial control computer; two synchronous waveform generating circuits respectively comprise a digital to analog conversion circuit, a low-pass filter circuit, a photoelectric isolation circuit and a power amplifying circuit; two power amplifying circuits are connected with an electromagnetic deflection coil; the frequency of a clock circuit is distributed by the complicated programmable logic device; a clock used for generating various frequencies is respectively used for serial communication, control of a collecting card, and generation of frequency-variable waveforms; the industrial control computer is used for controlling the complicated programmable logic device by the serial communication circuit; the complicated programmable logic device is used for generating the digital quantity of two waveforms under the triggering of the clock circuit; and an amplified signal is used for driving the electromagnetic deflection coil to generate a magnetic field so as to scan the deflection of an electron beam. The device has high control accuracy for scanning the deflection of the electron beam; and a digital circuit can largely enhance the anti-disturbance capability of the device.