Disclosed is a testing method of dielectrics voltage resistance conditions before the aging of a shadow mask plasma display panel. The testing method is characterized in that a low frequency alternating voltage with an over-current protective device is loaded on a sustaining electrode and an addressing electrode firstly before the aging of the display panel, the voltage is gradually increased to the voltage used when the display panel becomes aged, dots that can not meet the dielectrics voltage resistance demand on the display panel are broken through antecedently in the process of increasingthe voltage gradually, so that the corresponding electrode will not be affected when in proceeding of high frequency aging, thereby the testing method can prevent the display panel from being scrapped caused by sparking when in high frequency alternating current aging. The testing method has the advantage of reducing manufacturing costs of the shadow mask plasma display panel (SMPDP).