The invention provides a transmission electronic microscope sample stage connector utilized for property measurement, a substrate for complement use and a production method of the substrate. The invention has the advantages of producing a general TEM sample stage connector by precise mechanical processing and integral semi-conduct process flow, and combining the representing performance of the TEM on the micro structure of the materials and the measuring performance of the material property with the substrate as the carrier. After the substrate finishes the micro structure representation of the TEM, the substrate is taken out and put into any property measuring device which is compatible with the substrate for measuring the mechanics, electronics, optics, thermology, acoustics properties of the materials; meanwhile, a corner of the slit is taken as a mark, thereby guaranteeing the structure representation and the property measurement of the TEM are in the same micro area, which thus can really associate the material micro structure with the properties. In addition, the property measurement can be performed prior to the TEM structure representation.